RESEARCH / A0223
Lattice-Matched Epitaxial Growth Enabling High-Entropy-Doped Single-Crystal Ni-Rich Oxide Cathodes
Read the original paper · 10.1021/acsnano.5c15947 ↗
Source figures may contain other techniques and soft X-ray spectra. C, N and O measurements are outside our current hard-XAFS testing range.
Figure 2. (a) SEM image, (b) XRD and Rietveld refinement, (c) IPF in the Z-direction and the key for the IPF map, (d) FIB-TEM image, (e) corresponding EDS elemental mapping, (f) SAED images, and (g) XANES results for Ni foil, NiO, Ni2O3, SC-Ni83, and HE-SC-Ni83 at the Ni K-edge, and the r-space FT-EXAFS spectra for (h) SC-Ni83 and (i) HE-SC-Ni83 at the Ni k-edge.
Figure 5. Structural evolution of SC-Ni83 and HE-SC-Ni83. First charge/discharge curves and in situ XRD analysis along with the variations of the unit cell volume for (a−c) SC-Ni83 and (d−f) HE-SC-Ni83. Ni K-edge XANES spectra of pristine and cycled (g) SC-Ni83 and (h) HE- SC-Ni83. FT-EXAFS spectra of pristine and cycled (i) SC-Ni83 and (j) HE-SC-Ni83.