RESEARCH / A0319
Photocatalytic ethylene production over defective NiO through lattice oxygen participation
Read the original paper · 10.1038/s41467-025-61634-z ↗
Source figures may contain other techniques and soft X-ray spectra. C, N and O measurements are outside our current hard-XAFS testing range.
Fig. 1 | Structural analysis of NiO-x catalysts. a Temperature-dependent operando XRD. b The EPR spectra. c PDF. d Normalized Ni K-edge XANES spectra. e FT k2χ(k) Ni K-edge EXAFS spectra. f The WT for the k2-weighted Ni K-edge EXAFS.
Fig. 4 | In situ characterizations and DFT calculations proposed reaction mechanism. a In situ EPR spectra of NiO-300 in the dark field with an Ar atmosphere and under light illumination with an Ar or C2H6 atmosphere. b and (c) In situ XAFS of NiO-300 in ethane under light irradiation (b) the normalized Ni K-edge spectra and (c) the FT k2χ(k) Ni K-edge EXAFS spectra. d Operando DRIFTS spectra