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S50 and S1200 are separate instruments. Performance and available options depend on the selected configuration.

XAFS

ConfigurationRapidXAFS 1MRapidXAFS 2MRapidXAFS 2M SmartRapidXAFS 2D Ultra
Energy range4.5–20 keV4.5–20 keV; extendable to 25 keV4.5–20 keV; extendable to 25 keV4.5–20 keV; extendable to 25 keV
Energy resolutionXANES: 0.5–1.5 eV; EXAFS: 1.5–10 eVXANES: 0.5–1.5 eV; EXAFS: 1.5–10 eVXANES: 0.5–1.5 eV; EXAFS: 1.5–10 eVXANES: 0.5–1.5 eV; EXAFS: 1.5–10 eV
Maximum flux at sample1 × 10⁶ photons/s at 8 keV3 × 10⁶ photons/s at 8 keV3 × 10⁶ photons/s at 8 keV5 × 10⁶ photons/s at 8 keV; optional rotating anode: up to 10⁷ photons/s
XAFS modesTransmissionTransmissionTransmissionTransmission and fluorescence
XES moduleNot availableOptionalOptionalOptional
In situ accessoriesStandard cells supportedMultiple cell configurationsConfirm configurationConfirm configuration
AutomationConfirm configurationConfirm configurationRobotic sample loading and unloadingConfirm configuration
Simultaneous dual-element measurementConfirm configurationConfirm configurationConfirm configurationSupported

XES

ConfigurationXEScopeRapid XES
Energy range1.1–8 keV4.5–20 keV
Energy resolutionUp to 0.5 eV; confirm measurement conditions≤1 eV (Cu Kα line)
MeasurementX-ray fluorescence emission spectroscopyConfirm configuration
Detection limitConfirm configuration50 ppm (brochure reference; sample and conditions dependent)
Rapid XES pro sourceConfirm configuration4 kW
Rapid XES pro modeConfirm configurationXES

XRD

ConfigurationSinospec D10 / Panda D10Sinospec P10Sinospec S50Sinospec S1200
Source power600–1600 W; configuration dependentConfirm configurationConfirm configurationConfirm configuration
Goniometerθ/θθ/θFour-circle kappaConfirm configuration
DetectionHigh-resolution 1D or 2D detectorConfirm configurationConfirm configurationConfirm configuration
ApplicationsPowders, thin films and in situ environmentsConfirm configurationConfirm configurationConfirm configuration
Sample positionsConfirm configurationUp to 12 × 8Confirm configurationConfirm configuration
AutomationConfirm configurationMultiple independently controlled mechanical axesConfirm configurationConfirm configuration
WorkflowConfirm configurationAutomated sample handling and phase / quantitative analysisConfirm configurationConfirm configuration
Instrument typeConfirm configurationConfirm configurationSingle-crystal X-ray diffractometerConfirm configuration
Source configurationConfirm configurationConfirm configurationRequest the model-specific technical specificationConfirm configuration
Instrument seriesConfirm configurationConfirm configurationConfirm configurationXRD
Technical specificationConfirm configurationConfirm configurationConfirm configurationRequest the dedicated S1200 specification
Discuss a systemSample evaluation
Enlarged source figure