Products / Soft XAS
proXAS

SOFT X-RAY ABSORPTION

proXAS

Soft X-ray NEXAFS

Laboratory NEXAFS for light-element K edges and selected transition-metal L edges, revealing electronic structure and coordination.

Standard energy range
200–1200 eV
Resolving power
E/ΔE = 1500

TECHNICAL SPECIFICATIONS

Source, resolution and workflow

Source
Debris-free laser-driven XUV source
Standard energy range
200–1200 eV
Custom energy range
100–200 eV (custom configuration)
Repetition rate
25 Hz
Source power stability
±1.5%
Spectrometer
Aberration-corrected flat-field spectrometer
Resolving power
E/ΔE = 1500
Sample mounting
Multi-sample stage
Instrument footprint
1.5 m × 1.0 m
Software
Integrated system control, spectral calibration and analysis

The brochure reports analysis down to 0.2 wt%; sample suitability and measurement conditions require assessment.

ELEMENTS & EDGES

A new view of light elements

K EDGEC · N · O

Examples of light-element K edges covered by the brochure.

L EDGETi · V · Mn

Examples of transition-metal L edges; confirm the target edge and configuration.

The company’s hard-XAFS test application form does not apply to proXAS. Published papers and application case studies are not yet available for this product. Please contact our technical team to discuss configuration and sample suitability.

Discuss instrument configuration →

NEXAFS APPLICATIONS

Electronic structure under relevant conditions

Investigate light elements and 3d transition metals, with sample configurations for thin films, gases and liquids. Applications include catalysis, batteries and environmental processes.

Representative NEXAFS spectra from the product brochure are shown alongside.

LABORATORY PLANNING

Plan the installation

Instrument footprint
1.5 m × 1.0 m
Planning
Allow additional space for operation, maintenance and auxiliary systems.
Utilities
Confirm power, cooling, vacuum, access, loading and environmental requirements with the technical team.
Optical layout from the brochure; not a room installation drawing.
Discuss a systemSample evaluation
Enlarged source figure