RESEARCH / A0378
High-Entropy Doping Enabling Ultrahigh Power Density for Advanced Sodium-Ion Batteries
Read the original paper · 10.1021/acsnano.5c01312 ↗
Source figures may contain other techniques and soft X-ray spectra. C, N and O measurements are outside our current hard-XAFS testing range.
Figure 2. (a) X-ray absorption near-edge structure (XANES) spectra of V-k edge. (b, c) Fourier transform extended X-ray absorption fine structure (FT-EXAFS) analysis. (d, e) 3D wavelet analysis of V2O3 and V foil. (f, g) 3D wavelet analysis of NVPF and NVMPF. (h) Ball-stick models of [V2O8F3] double octahedra for NVPF and NVMPF. (i) Electronic conductivity of NVPF and NVMPF determined by a four-probe conductivity tester.